參數(shù)資料
型號(hào)： SN54ABT8652JT
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
中文描述： 掃描測(cè)試設(shè)備與八路總線收發(fā)器和寄存器
文件頁(yè)數(shù)： 11/25頁(yè)
文件大?。?/td> 366K
代理商： SN54ABT8652JT
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
thereby reducing the number of bits per test pattern that must be applied to complete a test operation.
During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in
Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
instruction-register opcode description
The instruction-register opcodes are shown in Table 3. The following descriptions detail the operation of
each instruction.
Table 3. Instruction-Register Opcodes
BINARY CODE
BIT 7
→
BIT 0
MSB
→
LSB
00000000
SCOPE OPCODE
DESCRIPTION
SELECTED DATA
REGISTER
MODE
EXTEST/INTEST
BYPASS
Boundary scan
Boundary scan
Test
10000001
Bypass scan
Bypass
Normal
10000010
SAMPLE/PRELOAD
Sample boundary
Boundary scan
Normal
00000011
INTEST/EXTEST
BYPASS
BYPASS
Boundary scan
Boundary scan
Test
10000100
Bypass scan
Bypass
Normal
00000101
Bypass scan
Bypass
Normal
00000110
HIGHZ
Control boundary to high impedance
Bypass
Modified test
10000111
CLAMP
BYPASS
Control boundary to 1/0
Bypass
Test
10001000
Bypass scan
Bypass
Normal
00001001
RUNT
Boundary run test
Bypass
Test
00001010
READBN
Boundary read
Boundary scan
Normal
10001011
READBT
Boundary read
Boundary scan
Test
00001100
CELLTST
Boundary self test
Boundary scan
Normal
10001101
TOPHIP
Boundary toggle outputs
Bypass
Test
10001110
SCANCN
Boundary-control register scan
Boundary control
Normal
00001111
SCANCT
Boundary-control register scan
Boundary control
Test
All others
BYPASS
Bypass scan
Bypass
Normal
Bit 7 is used to maintain even parity in the 8-bit instruction.
The BYPASS instruction is executed in lieu of a SCOPE
instruction that is not supported in the ’ABT8652.
boundary scan
This instruction conforms to the IEEE Standard 1149.1-1990 EXTEST and INTEST instructions. The BSR is
selected in the scan path. Data appearing at the device input terminals is captured in the input BSCs, while data
appearing at the outputs of the normal on-chip logic is captured in the output BSCs. Data that has been scanned
into the input BSCs is applied to the inputs of the normal on-chip logic, while data that has been scanned into
the output BSCs is applied to the device output terminals. The device operates in the test mode.
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SN54ABT8952 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
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