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參數(shù)資料
| 型號： | SN54ABT8652FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| 中文描述： | 掃描測試設(shè)備與八路總線收發(fā)器和寄存器 |
| 文件頁數(shù)： | 21/25頁 |
| 文件大?。?/td> | 366K |
| 代理商： | SN54ABT8652FK |
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
21
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 14)
SN54ABT8652
MIN
SN74ABT8652
MIN
UNIT
MAX
MAX
fclock
tw
tsu
th
Clock frequency
CLKAB or CLKBA
0
100
0
100
MHz
Pulse duration
CLKAB or CLKBA high or low
A before CLKAB
↑
or B before CLKBA
↑
A after CLKAB
↑
or B after CLKBA
↑
3
3
ns
Setup time
5.1
4.5
ns
Hold time
0.5
0
ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 14)
SN54ABT8652
MIN
SN74ABT8652
MIN
UNIT
MAX
MAX
fclock
tw
Clock frequency
TCK
0
50
0
50
MHz
Pulse duration
TCK high or low
A, B, CLK, OEAB, OEBA, or S before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, OEAB, OEBA, or S after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
5
5
ns
5.1
5
tsu
Setup time
6
6
ns
6
6
0.6
0
th
Hold time
0.9
0
ns
0.9
0
td
tr
Delay time
50*
50
ns
μ
s
Rise time
1*
1
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
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| SN54ABT8652JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8952 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
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| SN54ABT8952FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8952JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
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