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參數(shù)資料
| 型號： | SN54ABT8245FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與八進(jìn)制總線收發(fā)器 |
| 文件頁數(shù)： | 3/25頁 |
| 文件大?。?/td> | 364K |
| 代理商： | SN54ABT8245FK |
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
functional block diagram
Boundary-Control
Register
Bypass Register
Boundary-Scan Register
Instruction Register
TDI
TMS
TCK
TDO
TAP
Controller
VCC
VCC
One of Eight Channels
OE
DIR
A1
B1
24
1
23
14
12
13
2
11
Pin numbers shown are for the DW and JT packages.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT8245JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT827FK | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT827JT | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN74ABT827DB | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT833 | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8245JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT827 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT827FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT827JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT833 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
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