參數(shù)資料
型號: SN54ABT8245FK
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
中文描述: 掃描測試設(shè)備與八進制總線收發(fā)器
文件頁數(shù): 16/25頁
文件大小: 364K
代理商: SN54ABT8245FK
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
16
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
simultaneous PSA and PRPG (PSA/PRPG)
Data appearing at the selected device input pins is compressed into an 8-bit parallel signature in the
shift-register elements of the selected input BSCs on each rising edge of TCK. This data is then updated in the
shadow latches of the selected input BSCs and applied to the inputs of the normal on-chip logic. At the same
time, an 8-bit pseudo-random pattern is generated in the shift-register elements of the selected output BSCs
on each rising edge of TCK, updated in the shadow latches, and applied to the associated device output pins
on each falling edge of TCK. Figures 8 and 9 illustrate the 8-bit linear-feedback shift-register algorithms through
which the signature and patterns are generated. An initial seed value should be scanned into the BSR before
performing this operation. Note that a seed value of all zeroes does not produce additional patterns.
=
=
M
A8-I
B8-O
A7-I
A6-I
A5-I
A4-I
A3-I
A2-I
A1-I
B7-O
B6-O
B5-O
B4-O
B3-O
B2-O
B1-O
Figure 8. 8-Bit PSA/PRPG Configuration (OEA = 0, OEB = 1)
=
=
M
B8-I
A8-O
B7-I
B6-I
B5-I
B4-I
B3-I
B2-I
B1-I
A7-O
A6-O
A5-O
A4-O
A3-O
A2-O
A1-O
Figure 9. 8-Bit PSA/PRPG Configuration (OEA = 1, OEB = 0)
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SN54ABT8245JT 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT827 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT827FK 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT827JT 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT833 制造商:TI 制造商全稱:Texas Instruments 功能描述:8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS