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參數(shù)資料
| 型號： | SN54ABT16260WD |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| 中文描述： | 12位至24位復用D型鎖存器具有三態(tài)輸出 |
| 文件頁數(shù)： | 5/8頁 |
| 文件大小： | 123K |
| 代理商： | SN54ABT16260WD |
SN54ABT16260, SN74ABTH16260
12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCBS204C – JUNE 1992 – REVISED MAY 1997
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT16260
MIN
SN74ABTH16260
MIN
UNIT
MIN
MAX
MAX
MAX
VIK
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5 V,
II = –18 mA
IOH = –3 mA
IOH = –3 mA
IOH = –24 mA
IOH = –32 mA
IOL = 48 mA
IOL = 64 mA
–1.2
–1.2
–1.2
V
2.5
2.5
2.5
VOH
3
3
3
V
VCC= 4 5 V
VCC = 4.5 V
2
2
2*
2
VOL
VCC= 4 5 V
VCC = 4.5 V
0.36
0.5
V
0.55*
0.55
Vhys
100
mV
II
Control
inputs
VCC = 0 to 5.5 V,
VI = VCC or GND
VCC = 2.1 V to 5.5 V,
VI = VCC or GND
±
1
±
1
±
1
μ
A
A or B ports
±
20
±
100
±
20
II(h ld)
II(hold)
A or B ports
VCC= 4 5 V
VCC = 4.5 V
VI = 0.8 V
VI = 2 V
100
100
μ
A
–100
–100
IOZPU
VCC = 0 to 2.1 V,
VO = 0.5 V to 2.7 V, OE = X
VCC = 2.1 V to 0,
VO = 0.5 V to 2.7 V, OE = X
VCC = 2.1 V to 5.5 V,
VO = 2.7 V, OE
≥
2 V
VCC = 2.1 V to 5.5 V,
VO = 0.5 V, OE
≥
2 V
VCC = 0,
VCC = 5.5 V,
VO = 5.5 V
VCC = 5.5 V,
±
50
±
50
±
50
μ
A
IOZPD
±
50
±
50
±
50
μ
A
IOZH§
10
10
10
μ
A
IOZL§
–10
–10
–10
μ
A
Ioff
VI or VO
≤
4.5 V
±
100
±
100
μ
A
ICEX
Outputs high
50
50
50
μ
A
IO
VO = 2.5 V
Outputs high
–50
–100
–225
–50
–225
–50
–225
mA
VCC= 5.5 V,
VCC = 5.5 V,
IO = 0,
VI = VCC or GND
1.5
1.5
1.5
ICC
Outputs low
63
63
63
mA
Outputs disabled
1
1
1
ICC#
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
VI = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
1.5
1.5
1.5
mA
Ci
Cio
3
pF
11.5
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
This parameter is characterized, but not production tested.
§The parameters IOZH and IOZL include the input leakage current.
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
#This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
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