參數(shù)資料
型號： S9S08SC4E0VTG
廠商： FREESCALE SEMICONDUCTOR INC
元件分類： 微控制器/微處理器
英文描述： MICROCONTROLLER, PDSO16
封裝： 0.65 MM PITCH, ROHS COMPLIANT, TSSOP-16
文件頁數(shù)： 17/31頁
文件大?。?/td> 765K
代理商： S9S08SC4E0VTG
Chapter 3 Electrical Characteristics
MC9S08SC4 MCU Series Data Sheet, Rev. 4
24
Freescale Semiconductor
3.13
EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the MCU resides. Board
design and layout, circuit topology choices, location and characteristics of external components as well as MCU software
operation all play a significant role in EMC performance. The system designer should consult Freescale applications notes such
as AN2321, AN1050, AN1263, AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC
performance.
3.13.1
Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell method in accordance
with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed with the microcontroller installed on a
custom EMC evaluation board while running specialized EMC test software. The radiated emissions from the microcontroller
are measured in a TEM cell in two package orientations (North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal to the reported
emissions levels.
Table 3-15. Radiated Emissions, Electric Field
Parameter
Symbol
Conditions
Frequency
fOSC/fBUS
Level1
(Max)
1 Data based on qualification test results.
Unit
Radiated emissions,
electric field
VRE_TEM
VDD = 5 V
TA = +25
oC
package type
16-TSSOP
0.15 – 50 MHz
4 MHz crystal
8 MHz bus
–7
dB
μV
50 – 150 MHz
–11
150 – 500 MHz
–11
500 – 1000 MHz
–10
IEC Level
N
—
SAE Level
1
—
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