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| 型號(hào)： | RM100341WFQMLV |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 計(jì)數(shù)移位寄存器 |
| 英文描述： | 100K SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CQFP24 |
| 封裝： | CERQUAD-24 |
| 文件頁(yè)數(shù)： | 8/12頁(yè) |
| 文件大?。?/td> | 190K |
| 代理商： | RM100341WFQMLV |
AC Electrical Characteristics (Continued)
V
EE = 4.2V to 5.7V, VCC = VCCA = GND
Symbol
Parameter
T
C = 55C
T
C = +25C
T
C = +125C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
s
Setup Time
D
n,Pn
0.60
ns
S
n
1.70
1.60
2.40
Figure 4
(Note 10)
t
h
Hold Time
D
n,Pn
0.90
ns
S
n
0.50
t
pw(H)
Pulse Width HIGH
2.00
ns
Figure 3
CP
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specifications which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and 55C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25C, +125C and 55C temperature (design characterization data).
Note 11: The propagation delay specified is for the switching of a single output. Delays may vary up to 0.40 ns if multiple outputs are switching simultaneously.
Test Circuitry
DS100315-6
Notes:
VCC,VCCA = +2V, VEE = 2.5V
L1, L2 and L3 = equal length 50
impedance lines
RT = 50 terminator internal to scope
Decoupling 0.1 F from GND to VCC and VEE
All unused outputs are loaded with 50
to GND
CL = Fixture and stray capacitance ≤ 3pF
Pin numbers shown are for Flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
5
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