參數(shù)資料
型號(hào)： NAND512R3A2CN6F
廠商： 意法半導(dǎo)體
英文描述： 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
中文描述： 512兆位，528 Byte/264字的頁(yè)面，1.8V/3V，NAND閃存芯片
文件頁(yè)數(shù)： 21/51頁(yè)
文件大?。?/td> 517K
代理商： NAND512R3A2CN6F
Software algorithms
NAND512-A2C
28/51
7
Software algorithms
This section gives information on the software algorithms that ST recommends to implement
to manage the Bad Blocks and extend the lifetime of the NAND device.
NAND Flash memories are programmed and erased by Fowler-Nordheim tunneling using a
high voltage. Exposing the device to a high voltage for extended periods can cause the
oxide layer to be damaged. For this reason, the number of program and erase cycles is
limited (see Table 14 for value) and it is recommended to implement Garbage Collection, a
Wear-Leveling Algorithm and an Error Correction Code, to extend the number of program
and erase cycles and increase the data retention.
To help integrate a NAND memory into an application ST Microelectronics can provide:
●
File System OS Native reference software, which supports the basic commands of file
management.
Contact the nearest ST Microelectronics sales office for more details.
7.1
Bad Block management
Devices with Bad Blocks have the same quality level and the same AC and DC
characteristics as devices where all the blocks are valid. A Bad Block does not affect the
performance of valid blocks because it is isolated from the bit line and common source line
by a select transistor.
The devices are supplied with all the locations inside valid blocks erased (FFh). The Bad
Block Information is written prior to shipping. Any block where the 6th byte (x8 device) / 1st
word (x16 device) in the spare area of the 1st page does not contain FFh is a Bad Block.
The Bad Block Information must be read before any erase is attempted as the Bad Block
Information may be erased. For the system to be able to recognize the Bad Blocks based on
the original information it is recommended to create a Bad Block table following the
flowchart shown in Figure 13.
7.2
NAND Flash memory failure modes
Over the lifetime of the device additional Bad Blocks may develop.
To implement a highly reliable system, all the possible failure modes must be considered:
●
Program/Erase failure: in this case the block has to be replaced by copying the data to
a valid block. These additional Bad Blocks can be identified as attempts to program or
erase them will give errors in the Status Register.
As the failure of a Page Program operation does not affect the data in other pages in
the same block, the block can be replaced by re-programming the current data and
copying the rest of the replaced block to an available valid block. The Copy Back
Program command can be used to copy the data to a valid block. See Section 6.4:
Copy Back Program for more details.
●
Read failure: in this case, ECC correction must be implemented. To efficiently use the
memory space, it is recommended to recover single-bit error in read by ECC, without
replacing the whole block.
Refer to Table 13 for the procedure to follow if an error occurs during an operation.
相關(guān)PDF資料
PDF描述
NAND512R3A2C 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
NAND512R4A2CN6F 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
NAND512R4A2CZA6E 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
NAND512R4A2CZA6F 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
NAND512R4A2C 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
NAND512R3A2CZA6E 功能描述:IC FLASH 512MBIT 63VFBGA RoHS:是 類別:集成電路 (IC) >> 存儲(chǔ)器 系列:- 產(chǎn)品變化通告:Product Discontinuation 26/Apr/2010 標(biāo)準(zhǔn)包裝:136 系列:- 格式 - 存儲(chǔ)器:RAM 存儲(chǔ)器類型:SRAM - 同步，DDR II 存儲(chǔ)容量:18M（1M x 18） 速度:200MHz 接口:并聯(lián) 電源電壓:1.7 V ~ 1.9 V 工作溫度:0°C ~ 70°C 封裝/外殼:165-TBGA 供應(yīng)商設(shè)備封裝:165-CABGA（13x15） 包裝:托盤 其它名稱:71P71804S200BQ
NAND512R3A2CZA6F 制造商:Micron Technology Inc 功能描述:SLC NAND Flash Parallel 1.8V 512Mbit 64M x 8bit 15us 63-Pin VFBGA T/R
NAND512R3A2DDI6 制造商:Micron Technology Inc 功能描述:NAND - Gel-pak, waffle pack, wafer, diced wafer on film
NAND512R3A2DZA6E 功能描述:IC FLASH 512MBIT 63VFBGA RoHS:是 類別:集成電路 (IC) >> 存儲(chǔ)器 系列:- 標(biāo)準(zhǔn)包裝:1,000 系列:- 格式 - 存儲(chǔ)器:EEPROMs - 串行 存儲(chǔ)器類型:EEPROM 存儲(chǔ)容量:4K (512 x 8) 速度:400kHz 接口:I²C，2 線串口 電源電壓:2.7 V ~ 5.5 V 工作溫度:-40°C ~ 85°C 封裝/外殼:8-SOIC（0.173"，4.40mm 寬） 供應(yīng)商設(shè)備封裝:8-MFP 包裝:帶卷 (TR)
NAND512R3A2SE06 制造商:Micron Technology Inc 功能描述:NAND - Gel-pak, waffle pack, wafer, diced wafer on film
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