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參數(shù)資料
| 型號(hào)： | NAND512R3A2C |
| 廠商： | 意法半導(dǎo)體 |
| 英文描述： | 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories |
| 中文描述： | 512兆位，528 Byte/264字的頁面，1.8V/3V，NAND閃存芯片 |
| 文件頁數(shù)： | 3/51頁 |
| 文件大小： | 517K |
| 代理商： | NAND512R3A2C |
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NAND512-A2C
Memory array organization
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Memory array organization
The memory array is made up of NAND structures where 16 cells are connected in series.
The memory array is organized in blocks where each block contains 32 pages. The array is
split into two areas, the main area and the spare area. The main area of the array is used to
store data whereas the spare area is typically used to store Error correction Codes, software
flags or Bad Block identification.
In x8 devices the pages are split into a main area with two half pages of 256 Bytes each and
a spare area of 16 Bytes. In the x16 devices the pages are split into a 256 Word main area
and an 8 Word spare area. Refer to Figure 5: Memory array organization.
Bad blocks
The NAND Flash 528 Byte/ 264 Word Page devices may contain Bad Blocks, that is blocks
that contain one or more invalid bits whose reliability is not guaranteed. Additional Bad
Blocks may develop during the lifetime of the device.
The Bad Block Information is written prior to shipping (refer to Section 7.1: Bad Block
management for more details).
Table 4 shows the minimum number of valid blocks in each device. The values shown
include both the Bad Blocks that are present when the device is shipped and the Bad Blocks
that could develop later on.
These blocks need to be managed using Bad Blocks Management, Block Replacement or
Error Correction Codes (refer to Section 7: Software algorithms).
Table 4.
Valid blocks
Density of Device
Min
Max
512Mbits
4016
4096
相關(guān)PDF資料 |
PDF描述 |
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| NAND512R4A2CN6F | 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories |
| NAND512R4A2CZA6E | 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories |
| NAND512R4A2CZA6F | 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories |
| NAND512R4A2C | 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories |
| NAND512W3A2CZA6E | 512 Mbit, 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| NAND512R3A2CZA6E | 功能描述:IC FLASH 512MBIT 63VFBGA RoHS:是 類別:集成電路 (IC) >> 存儲(chǔ)器 系列:- 產(chǎn)品變化通告:Product Discontinuation 26/Apr/2010 標(biāo)準(zhǔn)包裝:136 系列:- 格式 - 存儲(chǔ)器:RAM 存儲(chǔ)器類型:SRAM - 同步，DDR II 存儲(chǔ)容量:18M（1M x 18） 速度:200MHz 接口:并聯(lián) 電源電壓:1.7 V ~ 1.9 V 工作溫度:0°C ~ 70°C 封裝/外殼:165-TBGA 供應(yīng)商設(shè)備封裝:165-CABGA（13x15） 包裝:托盤 其它名稱:71P71804S200BQ |
| NAND512R3A2CZA6F | 制造商:Micron Technology Inc 功能描述:SLC NAND Flash Parallel 1.8V 512Mbit 64M x 8bit 15us 63-Pin VFBGA T/R |
| NAND512R3A2DDI6 | 制造商:Micron Technology Inc 功能描述:NAND - Gel-pak, waffle pack, wafer, diced wafer on film |
| NAND512R3A2DZA6E | 功能描述:IC FLASH 512MBIT 63VFBGA RoHS:是 類別:集成電路 (IC) >> 存儲(chǔ)器 系列:- 標(biāo)準(zhǔn)包裝:1,000 系列:- 格式 - 存儲(chǔ)器:EEPROMs - 串行 存儲(chǔ)器類型:EEPROM 存儲(chǔ)容量:4K (512 x 8) 速度:400kHz 接口:I²C，2 線串口 電源電壓:2.7 V ~ 5.5 V 工作溫度:-40°C ~ 85°C 封裝/外殼:8-SOIC（0.173"，4.40mm 寬） 供應(yīng)商設(shè)備封裝:8-MFP 包裝:帶卷 (TR) |
| NAND512R3A2SE06 | 制造商:Micron Technology Inc 功能描述:NAND - Gel-pak, waffle pack, wafer, diced wafer on film |
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