
Reliability Testing Result
Page12
Reliability Testing Result
Applicable Standard
Testing Conditions
Duration
Failure
Room Temp.
Operating Life
EIAJ ED-
4701/100(101)
Ta = 25
℃
, I
F
= 20mA/1chip
500 h
0/24
High Temp.
Operating Life
EIAJ ED-
4701/100(101)
Ta = 85
℃
,I
F
= 5mA/1chip
500 h
0/24
Low Temp.
Operating Life
EIAJ ED-
4701/100(101)
Ta = -30
℃
, I
F
= 20mA/1chip
500 h
0/24
Wet High Temp.
Operating Life
EIAJ ED-
4701/100(102)
Ta = 60
℃
, 90%, I
F
= 20mA/1chip
500 h
0/24
Dynamic
Operating Life
EIAJ ED-
4701/100(101)
Ta = 60
℃
, I
FRM
= 50mA/1chip,
Pulse Width = 0.5s, Duty = 1/4
20,000 cycles
0/24
Wet High Temp.
Storage Life
EIAJ ED-
4701/100(103)
Ta = 60
℃
, 90%
1,000 h
0/24
Thermal Shock
EIAJ ED-
4701/100(105)
Ta = -40
℃
~
100
℃
(each 15min.)
200 cycles
0/24
High Temp.
Storage Life
EIAJ ED-
4701/200(201)
Ta = 100
℃
1,000 h
0/24
Low Temp.
Storage Life
Cycled Temp.
Humidity Life
EIAJ ED-
4701/200(202)
EIAJ ED-
4701/200(203)
Ta = -40
℃
1,000 h
0/24
Ta = -10
℃
~
65
℃
, 95%, 24h/cycle
10 cycles
0/24
Resistance to
Reflow Soldering
EIAJ ED-
4701/300(301)
Preheat : 150
~
180
℃
(120s Max.)
Soldering Temp. : 260
℃
(5s)
Moisture Soak : 30
℃
, 70%, 72h
Twice
0/24
Electric Static Discharge
(ESD)
EIAJ ED-
4701/300(304)
C = 100pF, R2 = 1.5K
Ω
, ±1,000V
once each polarity
0/24
Vibration,
Variable Frequency
EIAJ ED-
4701/400(403)
98.1m/s
2
(10G), 100
~
2KHz, 20min,
XYZ each direction
2 h
0/12
Failure Criteria
Items
Symbols
Conditions
Failure criteria
Luminous Intensity
Iv
I
F
=20mA/1chip
Testing Min. Value
<
Spec. Min. Value x 0.5
Forward Voltage
V
F
IF=20mA/1chip
Testing Max. Value
≧
Spec. Max. Value x 1.2
Reverse Current
I
R
V
R
=5V/1chip
Testing Max. Value
≧
Spec. Max. Value x 2.5
Cosmetic Appearance
-
-
Occurrence of notable decoloration,
deformation and cracking
KW1305A
3.5 x 3.5 mm (h=1.6 mm) Type White LED
2007.10.31