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參數(shù)資料
| 型號： | KIT33794DWBEVM |
| 廠商： | Freescale Semiconductor |
| 文件頁數(shù)： | 1/18頁 |
| 文件大?。?/td> | 0K |
| 描述： | KIT EVAL FOR MC33794 EFS SYSTEM |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 其它名稱： | KIT33794DHEVM KIT33794DHEVM-ND |
Document Number: MC33794
Rev 9, 11/2006
Freescale Semiconductor
Technical Data
Freescale Semiconductor, Inc., 2006. All rights reserved.
Electric Field Imaging Device
The MC33794 is intended for applications where noncontact sensing of
objects is desired. When connected to external electrodes, an electric field is
created.,The MC33794 is intended for use in detecting objects in this electric
field. The IC generates a low-frequency sine wave. The frequency is adjustable
by using an external resistor and is optimized for 120 kHz. The sine wave has
very low harmonic content to reduce harmonic interference.
The MC33794 also contains support circuits for a microcontroller unit (MCU)
to allow the construction of a two-chip E-field system.
Features
Supports up to 9 Electrodes and 2 References or Electrodes
Shield Driver for Driving Remote Electrodes Through Coaxial Cables
+5.0 V Regulator to Power External Circuit
ISO-9141 Physical Layer Interface
Lamp Driver Output
Watchdog and Power-ON Reset Timer
Critical Internal Nodes Scaled and Selectable for Measurement
High-Purity Sine Wave Generator Tunable with External Resistor
Typical Applications
Occupant Detection Systems
Appliance Control Panels and Touch Sensors
Linear and Rotational Sliders
Spill Over Flow Sensing Measurement
Refrigeration Frost Sensing
Industrial Control and Safety Systems Security
Proximity Detection for Wake-Up Features
Touch Screens
Garage Door Safety Sensing
Liquid Level Sensing
ORDERING INFORMATION
Device Name
Temperature Range (TA)
Package
Drawing
Package
MC33794EK/R2
-40°C to 85°C
1390-02
54 SOICW-EP
ELECTRIC FIELD
IMAGING DEVICE
MC33794
EK SUFFIX
54-LEAD SOICW-EP
CASE 1390-02
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