參數(shù)資料
型號(hào): DS1225Y-200
廠商: DALLAS SEMICONDUCTOR
元件分類: Static RAM
英文描述: 8K X 8 NON-VOLATILE SRAM MODULE, 200 ns, PDIP28
文件頁數(shù): 12/12頁
文件大?。?/td> 125K
代理商: DS1225Y-200
MAX381/MAX383/MAX385
Precision, Low-Voltage Analog Switches
_______________________________________________________________________________________
9
VGEN
GND
CL
1.0nF
VOUT
0V
-5V
V-
V+
RGEN
VOUT
IN
ON
OFF
ON
VOUT
Q = (
VOUT) (CL)
+5V
COM
NC or NO
MAX381
MAX383
MAX385
Figure 4. Charge-Injection Test Circuit
50%
tOFF
tr < 20ns
tf < 20ns
VOUT
tON
0.9 x VOUT
+3V
0V
LOGIC
INPUT
SWITCH
OUTPUT
LOGIC INPUT WAVEFORM IS INVERTED FOR
SWITCHES THAT HAVE THE OPPOSITE LOGIC
SENSE CONTROL.
+5V
VOUT
RL = 1000
CL = 35pF
-5V
REPEAT TEST FOR EACH SWITCH
0V
GND
LOGIC
INPUT
VCOM = +3V (for tON)
VCOM = -3V (for tOFF)
FOR LOAD CONDITIONS, SEE
Electrical Characteristics.
CL INCLUDES FIXTURE AND STRAY CAPACITANCE.
VOUT = VCOM
RL
RL + RON
V+
V-
COM
IN
NC or NO
(
)
MAX381
MAX383
MAX385
50%
VOUT1
VOUT2
0.9 x VOUT
+3V
0V
LOGIC
INPUT
SWITCH
OUTPUT 1
SWITCH
OUTPUT 2
+5V
V+
V-
-5V
CL INCLUDES FIXTURE AND STRAY CAPACITANCE.
LOGIC 0 INPUT
0V
GND
LOGIC
INPUT
0V
0.9 x VOUT
tD
IN
RL2
CL2
VOUT2
RL1
VOUT1
CL1
RL = 1000
CL = 35pF
COM
NC
NO
MAX383
VCOM = +3V
Figure 2. Switching-Time Test Circuit
Figure 3. Break-Before-Make Test Circuit (MAX383 only)
______________________________________________Test Circuits/Timing Diagrams
相關(guān)PDF資料
PDF描述
DS1230AB-120 32K X 8 NON-VOLATILE SRAM MODULE, 120 ns, DMA28
DS1230AB-150 32K X 8 NON-VOLATILE SRAM MODULE, 150 ns, DMA28
DS1230AB-100 32K X 8 NON-VOLATILE SRAM MODULE, 100 ns, DMA28
DS1230ABP-70 32K X 8 NON-VOLATILE SRAM MODULE, 70 ns, DMA34
DS1230Y-70 32K X 8 NON-VOLATILE SRAM MODULE, 70 ns, DMA28
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