參數(shù)資料
型號: ATA555814M01-PP
廠商: Atmel Corp.
英文描述: 1 kbit R/W IDIC with Deterministic Anticollision
中文描述: 1千比特讀/寫的確定性防撞投資業(yè)務
文件頁數(shù): 37/42頁
文件大?。?/td> 557K
代理商: ATA555814M01-PP
37
4681C–RFID–09/05
ATA5558 [Preliminary]
Figure 9-1.
Measurement Setup for V
mod
7
Programming time
From last command gap to
SOF pattern
(36 + 648 internal clocks)
Erase all/Write all
(1)
Top = 55
°
C
(1)
Top = 150
°
C
(1)
Top = 250
°
C
(1)
Mask option
(5)
T
prog
5
5.7
6
ms
T
8
Endurance
n
cycle
t
retention
t
retention
t
retention
100000
Cycles
Q
9.1
Data retention
10
20
50
Years
9.2
96
hrs
T
9.3
24
hrs
Q
10
Resonance capacitor
Cr
70
78
86
pF
T
9.
T
amb
= +25°C; f
coil
= 125 kHz; unless otherwise specified
No.
Parameters
Electrical Characteristics (Continued)
Test Conditions
Symbol
Min.
Typ.
Max.
Unit
Type*
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
1. EEPROM device performance can be influenced by subsequent customer assembly processes especially if subjected to
high temperatures or mechanical stress conditions. So Atmel confirms these parameters only for devices as they leave the
Atmel production, as undiced wafers or diced wafers in tray, etc.
2. Current into Coil 1/Coil 2 is limited to 10 mA. The damping characteristics are defined by the internally limited supply volt-
age (= minimum AC coil voltage).
3. I
DD
measurement setup R = 100 k
; V
CLK
= V
coil
= 5 V: EEPROM programmed to
00 ... 000
(erase all); NRZ, public mode.
I
DD
= (V
OUTmax
– V
CLK
)/R
4. V
mod
measurement setup: R = 2.3 k
; V
CLK
= 3 V; setup with modulation enabled (see
Figure 9-1 on page 37
).
5. The tolerance of the on-chip resonance capacitor is ±10% at 3s over whole production. The capacitor tolerance is
±3% at 3
σ
on a wafer basis.
Coil 1
ATA5558
Coil 2
Substrate
-
+
V
CLK
R
750
750
BAT68
BAT68
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