參數(shù)資料
型號(hào): 74F823
廠商: NXP Semiconductors N.V.
英文描述: Bus interface registers
中文描述: 總線接口寄存器
文件頁(yè)數(shù): 10/18頁(yè)
文件大?。?/td> 140K
代理商: 74F823
Philips Semiconductors
Product specification
74F821/822/823/824/825/826
Bus interface registers
1996 Jan 05
10
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
V
IH
V
IL
I
Ik
I
OH
I
OL
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High–level output current
–24
mA
Low–level output current
64
mA
T
amb
Operating free-air temperature range
O erating free-air tem erature range
Commercial range
0
+70
°
C
°
C
Industrial range
–40
+85
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
= 15mA
I
OH
= –15mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.4
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
IL
V
= MAX,
V
IH
= MIN
2.4
V
= 24mA
I
OH
= –24mA
2.0
V
2.0
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.55
V
±
5%V
CC
0.42
0.55
V
V
IK
I
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX, V
O
= 2.7V
V
CC
= MAX, V
O
= 0.5V
V
CC
= MAX
–0.73
–1.2
V
Input current at maximum input voltage
100
μ
A
μ
A
μ
A
μ
A
μ
A
High–level input current
20
Low–level input current
–20
Off–state output current, high–level voltage applied
50
Off–state output current, low–level voltage applied
Short–circuit output current
3
–50
-100
-225
mA
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCZ
75
105
mA
74F821,
74F822
V
CC
= MAX
75
105
mA
75
115
mA
65
100
mA
I
CC
Supply current (total)
74F823,
74F824
V
CC
= MAX
70
105
mA
75
110
mA
60
85
mA
74F825,
74F826
V
CC
= MAX
60
90
mA
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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